Novel routes for in-situ measurements during the manufacture of thin flexible electronic films.

This PhD project aims to develop novel metrology techniques for thin flexible films made via a range on industrial manufacturing routes, such as slot-die coating.  Such films find use as flexible electronics, light generating films, or as photovoltaic films.

Through this work the successful applicant will develop novel imaging approaches to develop ways to measure film thickness, roughness, uniformity, and crystallinity; all these aspect play a crucial role in the final performance of these devices.  Areas and approaches to explore include mono-chromatic and multi-chromatic illumination, structured illumination, and telecentric illumination distortions.

Computer based image analysis approaches will be developed, including parallel processing, FPGA coding and analysis, along with Machine Learning and AI based image analysis.

The final aim of the project will be to generate in-situ / live film profile data to coating line operators to help direct and inform coating process set-ups. Applications for research programmes with synergies to the above described research are also welcomed.

The applicant will work in a well-equipped laboratory space with access to state-of-the-art manufacturing and metrology systems.

How to apply:

Applicants should have a minimum of an upper second class honours degree in Physical Sciences and Engineering, such as Materials Science, Physics, Chemistry, Chemical Engineering or Mechanical Engineering. If English is not your first language then you must have an International English Language Testing System (IELTS) average of 6.5 or above with at least 6.0 in each component, or equivalent. Please see this link for further information: https://www.sheffield.ac.uk/postgraduate/phd/apply/english-language.

Please see this link for information on how to apply: https://www.sheffield.ac.uk/cbe/postgraduate/phd/how-apply. Please include the name of your proposed supervisor and the title of the PhD project within your application.