PROGRAM ENGINEER, METROLOGY/CHARACTERIZATION, MIT.nano, to support the Technical Concierge Service of the Northeast Microelectronics Coalition (NEMC) Hub; combine expert-level technical matchmaking, cross-facility coordination, and hands-on microfabrication and characterization work; help translate early-stage concepts into manufacturable processes by connecting users with the most appropriate facilities, expertise, and resources across the regional microelectronics ecosystem; serve as a key interface between academic researchers, industry partners, government organizations, and startups, ensuring efficient Lab-to-Fab translation and play a critical role in strengthening the regional microelectronics ecosystem, enabling researchers and innovators to rapidly access the infrastructure and expertise required to move ideas from concept to manufacturing.
A full job description can be found here: https://mitnano.mit.edu/opportunities/mitnano-job-opportunity-program-engineer-metrology-characterization.
Job Requirements
REQUIRED: Bachelor’s degree in electrical engineering, materials science, applied physics, microelectronics, or a related field; a minimum of seven years of related experience in a research environment (including graduate student experience); demonstrated experience with materials and device characterization techniques, such as electrical measurements (IV/CV), microscopy (SEM, AFM), spectroscopy (e.g., XPS, Raman), or thin-film/materials analysis; strong understanding of metrology principles, including calibration, measurement uncertainty, repeatability, and data integrity; strong ability to evaluate technical problems and propose practical experimental, fabrication, and measurement-driven validation pathways; and excellent communication skills and ability to work with multidisciplinary teams across academia and industry. PREFERRED: PhD in a related field; experience working in shared research facilities or user laboratories; experience developing SOPs or training materials, metrology protocols and documentation standards; experience correlating process parameters with characterization data and device performance metrics; and knowledge of regional and national microelectronics infrastructure networks.
US work authorization is required.
This is a one-year appointment with potential for extension based on funding.