Scanning Electron Microscopist I

Position Summary

The Scanning Electron Microscopist will support research, education, and outreach efforts working full-time in the Center for Advanced Microscopy. The most successful candidates will have the following knowledge, skills, and abilities:

• Proficiency in independent Scanning Electron Microscope operation.
• Conceptual understanding of the components of scanning electron microscopes, including electron sources and detectors, X-ray generation and detection via EDS, and impacts of changing different imaging parameters on image quality and characteristics.
• Knowledge and skills related to working successfully and safely with vacuum equipment and hazardous chemicals.
• Detail-oriented approach to work that supports a welcoming, safe, clean, and organized laboratory environment.
• Communication: Communicates clearly and credibly in both verbal and written forms with diverse audiences.
• Teamwork: Build productive working relationships to support collaboration and shared success.
• Organization: Effectively provides support to multiple projects and people. Organizes work, deliverables, and service needs with precision and logical structure.

Minimum Requirements

• Knowledge equivalent to that which normally would be acquired by completing a four-year college degree program in science such as Biology, Chemistry, Earth Science, Microscopy, Physics, Chemical, Electrical, or Materials Engineering, or in a related science field.
• Six months to one year of related progressively more responsible or expansive work experience with scanning electron microscopes and preparing samples for electron microscopy; or an equivalent combination of education and experience
• Formal coursework completed in scanning electron microscopy.

Desired Qualifications

• A 4-year or MS degree in science or engineering that includes concepts and skills from electron microscopy, such as chemistry, electricity and magnetism, and/or microstructure / ultrastructure.
• Experience in preparing a range of sample/material types for scanning electron microscopy.
• Experience with a range of scanning electron microscope detectors and imaging / analysis modes, including secondary and backscattered electron imaging and energy-dispersive X-ray analysis.
• Experience working with students and/or researchers in a multi-user laboratory environment.