Rate My Professor Daniel Haasmann

Dr. Daniel Haasmann is a Senior Lecturer in the School of Engineering and Built Environment, Electrical and Electronic Engineering at Griffith University, where he is also affiliated with the Queensland Micro- and Nanotechnology Centre. He obtained his Bachelor's degree with Honours in Microelectronic Engineering from Griffith University in 2008 and his PhD in Microelectronic Engineering with a focus on Semiconductor Physics from the Queensland Micro- and Nanotechnology Centre at Griffith University in 2015. Possessing over 12 years of experience in semiconductor physics, Haasmann specializes in the development and electrical characterisation of gate oxides for SiC MOS devices, advancing power semiconductor technologies essential for high-efficiency applications.

Haasmann's research contributions include leading developments in silicon carbide power devices, notably as part of the Griffith University team that created a breakthrough SiC transistor reducing energy losses, positioning it as a potential paradigm shift in semiconductor manufacturing for renewable energy, electric vehicles, and industrial power systems. His key publications encompass 'Energy position of the active near-interface traps in metal–oxide–semiconductor field-effect transistors on 4H–SiC' (Applied Physics Letters, 2013), 'Quantified density of performance-degrading near-interface traps in 4H-SiC MOSFETs' (Scientific Reports, 2022), 'The effect of wafer thinning and thermal capacitance on chip-level surge current capability of SiC Schottky diodes' (Scientific Reports, 2023), 'Improvement of channel-carrier mobility in 4H-SiC MOSFETs' (AIP Advances, 2023), 'Detection of near-interface traps in NO annealed 4H-SiC MOS capacitors' (Journal of Applied Physics, 2022), and 'A Method and Criterion for Repetitive Surge Current in Silicon Carbide Schottky Diodes' (IEEE Access, 2025). These works address critical issues such as interface traps, carrier mobility, and surge current reliability in SiC devices, enhancing their performance and robustness in power electronics.