Rate My Professor Jay Warnett

Warnett's research specializations centre on developing faster XCT scanning procedures via innovative acquisition methods and data minimization, alongside error quantification for metrology. His interests encompass dimensional XCT, non-destructive testing, granular flows, and applications in manufacturing, battery analysis, forensics, archaeology, and food science. He co-authored the EPSRC Tomography Roadmap, shaping policy for high-throughput CT and strategic equipment funding. As Co-Investigator on the National Research Facility for XCT, with Warwick leading metrology, he advances national capabilities. Warnett holds roles as Secretary of the ToScA international conference on tomography for scientific applications, committee member for the dimensional XCT conference, and contributor to working groups developing the ISO 10360 standard for XCT.

With over 1,500 citations and an h-index of 22 on Google Scholar, Warnett's key publications include '“Don’t stop me now!”: Stopping rules for iterative reconstruction with dimensional X-ray computed tomography' (2025), 'Quantifying electrochemical degradation in single-crystalline NMC cathodes using X-ray computed tomography' (2023), 'Performance testing of dimensional X-ray computed tomography systems' (2022), and 'Design & Manufacture of a High-Performance Bicycle Crank using Carbon Fibre Reinforced Polymer' (2018). His work demonstrates impact through XCT analysis of biscuit structures for baking optimization, historical artifacts like astrolabes and bells, and forensic evidence. He teaches modules such as Image Analysis and Reconstruction and delivers XCT courses.